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A Modified and Calibrated Drift-Diffusion-Reaction Model for Time-Domain Analysis of Charging Phenomena in Electron-Beam Irradiated Insulators

机译:一种改进的,校准的时域漂移 - 扩散反应模型   电子束辐照绝缘子充电现象分析

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摘要

This paper presents an improved version of the previously proposedself-consistent drift-diffusion-reaction model correcting for non-physicalbehavior at longer time scales. To this end a novel boundary condition isemployed that takes into account the effect of tertiary electrons and a fullydynamic trap-assisted generation-recombination mechanism is implemented.Sensitivity of the model with respect to material parameters is investigatedand a calibration procedure is developed that reproduces experimentalyield-energy curves for uncharged insulators. Long-time charging and yieldvariations are analyzed for stationary defocused and focused beams as well asmoving beams dynamically scanning composite insulators.
机译:本文提出了以前提出的自洽漂移-扩散-反应模型的改进版本,该模型可以在更长的时间尺度上校正非物理行为。为此目的,考虑到叔电子的影响,采用了一种新颖的边界条件,并实现了一种全动态的陷阱辅助的生成-复合机制。研究了该模型对材料参数的敏感性,并开发了一种校准程序,该程序再现了实验的产率。不带电绝缘子的能量曲线。针对固定散焦和聚焦光束以及动态扫描复合绝缘子的移动光束,分析了长期充电和屈服变化。

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